Refractive-index profiling of buried planar waveguides by an inverse Wentzel-Kramer-Brillouin method
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
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Detail(s)
Original language | English |
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Pages (from-to) | 1367-1373 |
Journal / Publication | Journal of Lightwave Technology |
Volume | 26 |
Issue number | 11 |
Publication status | Published - 1 Jun 2008 |
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Abstract
We propose an inverse Wentzel-Kramer-Brillouin (WKB) method for the construction of the refractive-index profiles of buried graded-index planar waveguides from the measured effective indexes of the guided modes. Our method involves experimental determination of the location of the peak index in the buried profile, measurement of the effective indexes in air, and an index-matching liquid, and application of a searching algorithm to find the best-fit profile through inverting the WKB equations. We present numerical examples and experimental results to demonstrate the performance of the method. © 2008 IEEE.
Research Area(s)
- Buried waveguide, Graded-index waveguide, Optical planar waveguide, Optical waveguide, Refractive-index measurement, Wentzel-Krame Brillouin (WKB) method
Citation Format(s)
Refractive-index profiling of buried planar waveguides by an inverse Wentzel-Kramer-Brillouin method. / Chiang, Kin Seng; Liu, Qing; Lor, Kar Pong.
In: Journal of Lightwave Technology, Vol. 26, No. 11, 01.06.2008, p. 1367-1373.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review