Three-layer dielectric waveguide with microstrip transition
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
Original language | English |
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Title of host publication | IEEE iWEM 2013 - 2013 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition |
Publisher | IEEE Computer Society |
Pages | 53-56 |
ISBN (print) | 9781479903597 |
Publication status | Published - 2013 |
Workshop
Title | 2013 IEEE International Workshop on Electromagnetics (IEEE iWEM 2013) |
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Place | Hong Kong |
City | Kowloon |
Period | 1 - 3 August 2013 |
Link(s)
Abstract
A three-layer dielectric waveguide is and its transition to microstrip line is proposed and investigated. The proposed waveguide consists of three layer, high dielectric constant layer at the top layer, low dielectric constant at the middle layer, and ground plane at the bottom layer. A simple and compact microstrip transition is proposed and integrated for measurement purpose. A 20mm long section of the proposed waveguide with two microstrip transitions were designed and tested. In the measurement, the total insertion loss is around 3.3dB. The total insertion loss of the proposed waveguide and two transitions is around 1.8dB, while the loss of the two sections of the microstrip line and the test fixture is around 1.5dB. © 2013 IEEE.
Citation Format(s)
Three-layer dielectric waveguide with microstrip transition. / Xue, Quan; Zhu, Hao Tian; Chiu, Leung.
IEEE iWEM 2013 - 2013 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition. IEEE Computer Society, 2013. p. 53-56 6888768.
IEEE iWEM 2013 - 2013 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition. IEEE Computer Society, 2013. p. 53-56 6888768.
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review