Ion Migration in Perovskite Light-Emitting Diodes : Mechanism, Characterizations, and Material and Device Engineering

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Author(s)

  • Nan Li
  • Yongheng Jia
  • Yuwei Guo
  • Ni Zhao

Detail(s)

Original languageEnglish
Article number2108102
Journal / PublicationAdvanced Materials
Volume34
Issue number19
Online published30 Nov 2021
Publication statusPublished - 12 May 2022
Externally publishedYes

Abstract

In recent years, perovskite light-emitting diodes (PeLEDs) have emerged as a promising new lighting technology with high external quantum efficiency, color purity, and wavelength tunability, as well as, low-temperature processability. However, the operational stability of PeLEDs is still insufficient for their commercialization. The generation and migration of ionic species in metal halide perovskites has been widely acknowledged as the primary factor causing the performance degradation of PeLEDs. Herein, this topic is systematically discussed by considering the fundamental and engineering aspects of ion-related issues in PeLEDs, including the material and processing origins of ion generation, the mechanisms driving ion migration, characterization approaches for probing ion distributions, the effects of ion migration on device performance and stability, and strategies for ion management in PeLEDs. Finally, perspectives on remaining challenges and future opportunities are highlighted. © 2022 Wiley-VCH GmbH.

Research Area(s)

  • device engineering, device stability, ion migration, perovskite light-emitting diodes