Tellurium n-type doping of highly mismatched amorphous GaN1-xAsxalloys in plasma-assisted molecular beam epitaxy
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 9-13 |
Journal / Publication | Journal of Crystal Growth |
Volume | 404 |
Publication status | Published - 2014 |
Externally published | Yes |
Link(s)
Abstract
In this paper we report our study on n-type Te doping of amorphous GaN1-xAsxlayers grown by plasma-assisted molecular beam epitaxy. We have used a low temperature PbTe source as a source of tellurium. Reproducible and uniform tellurium incorporation in amorphous GaN1-xAsxlayers has been successfully achieved with a maximum Te concentration of 9×1020cm-3. Tellurium incorporation resulted in n-doping of GaN1-xAsxlayers with Hall carrier concentrations up to 3×1019cm-3and mobilities of ~1 cm2/V s. The optimal growth temperature window for efficient Te doping of the amorphous GaN1-xAsxlayers has been determined.
Research Area(s)
- A3. Molecular beam epitaxy, B1. Nitrides, B2. Semiconducting III-V materials
Citation Format(s)
Tellurium n-type doping of highly mismatched amorphous GaN1-xAsxalloys in plasma-assisted molecular beam epitaxy. / Novikov, S. V.; Ting, M.; Yu, K. M. et al.
In: Journal of Crystal Growth, Vol. 404, 2014, p. 9-13.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review