Background analysis of field-induced electron emission from nanometer-scale heterostructured emitters

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • Valeriu Filip
  • Dan Nicolaescu
  • Ion Cosma Fulga
  • Tudor Mitran
  • Hei Wong

Related Research Unit(s)

Detail(s)

Original languageEnglish
Pages (from-to)711-718
Journal / PublicationJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume27
Issue number2
Publication statusPublished - 2009

Abstract

Theoretical approaches to electron field emission from nanostructured cathodes often need to predict stationary vacuum currents by means of the time-dependent decay theory of metastable states. This rigorous (but practically untractable) treatment is usually mitigated by various procedures. In this work the authors present a new method based on the hypothesis of the continuity of the electron localization probability at the vacuum interface of the heterostructure. The method is compared to other conventional approaches, in terms of both the obtained vacuum probability current and field-emission current. The computed probability current is very close to that obtained from conventional approaches for the same energy spectra. However, conventional methods fail to predict the field-emission behavior from shallow-well heterostructures. © 2009 American Vacuum Society.

Citation Format(s)

Background analysis of field-induced electron emission from nanometer-scale heterostructured emitters. / Filip, Valeriu; Nicolaescu, Dan; Fulga, Ion Cosma et al.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 27, No. 2, 2009, p. 711-718.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review