Terahertz free-space dielectric property measurements using time- and frequency-domain setups

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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Detail(s)

Original languageEnglish
Article numbere21839
Journal / PublicationInternational Journal of RF and Microwave Computer-Aided Engineering
Volume29
Issue number9
Online published24 May 2019
Publication statusPublished - Sept 2019

Link(s)

DOI

DOI
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Link to Scopus https://www.scopus.com/record/display.uri?eid=2-s2.0-85066235030&origin=recordpage
Permanent Link https://scholars.cityu.edu.hk/en/publications/publication(3b30d524-b4f5-4222-be1f-8c84b0e6c1da).html

Abstract

Based on a simple and effective calculation method, two free-space measurement setups are employed to investigate the dielectric properties of various materials at terahertz (THz) frequencies. One setup involves THZ time-domain spectroscopy (THz-TDS) at a frequency range of 0.4 to 1 THz. The other setup comprises a vector network analyzer (VNA) with pairs of VAN extenders (VNAXs) and diagonal standard gain horns (SGHs) at a frequency range of 0.22 to 1.1 THz. The calculation method is verified for the THz-TDS system and employed in the VNA system for the first time. Dielectric properties, including refractive indices, power absorption coefficients, relative permittivities, and loss tangents, are calculated from measured transmission data. Several materials, including printed circuit boards and 3D printing materials, are characterized to verify the calculation method and compare the measurement setups.

Research Area(s)

  • dielectric properties, free space, terahertz (THz), terahertz time-domain spectroscopy (THz-TDS), vector network analyzer (VNA)

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Publication fingerprints text

100
Dielectrics Engineering
100
Frequency Domain Engineering
100
Terahertz Engineering
100
Time Domain Engineering
100
Free Space Engineering
100
Measurement Engineering
100
space INIS
100
calculation methods INIS
100
dielectric properti... INIS
100
Dielectric Properti... Keyphrases
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Citation Format(s)

[ RIS ] [ BibTeX ]
Terahertz free-space dielectric property measurements using time- and frequency-domain setups. / Ruan, Xuexuan; Chan, Chi Hou.
In: International Journal of RF and Microwave Computer-Aided Engineering, Vol. 29, No. 9, e21839, 09.2019.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review