"Will You Get What You Want? Managerial Ties, Knowledge Acquisition, and Firm Performance in China"

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)Not applicablepeer-review

1 Scopus Citations
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Author(s)

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Detail(s)

Original languageEnglish
Title of host publicationAcademy of Management 2013 Annual Meeting, AOM 2013
PublisherAcademy of Management
Pages1022-1027
Publication statusPublished - Aug 2013

Publication series

NameAcademy of Management 2013 Annual Meeting, AOM 2013

Conference

Title73rd Annual Meeting of the Academy of Management, AOM 2013
PlaceUnited States
CityOrlando
Period10 - 12 August 2013

Abstract

Integrating research in knowledge-based view and resource-dependence theory, this study proposes that the utilization of business ties differs significantly from that of political ties in acquiring external knowledge, which subsequently affects firm performance in supplier-distributor alliances. Specifically, we argue that the utilization of business ties enables suppliers to access deeper knowledge from distributors, while the utilization of political ties facilitates suppliers to acquire broader knowledge from distributors. As a result, the knowledge acquisition mediates the influences of managerial ties on firm performance. Further, the power structure between suppliers and distributors moderates the impacts of managerial ties on knowledge acquisitions. Our analyses of matched dyads of suppliers and distributors in China largely support our theses in this study.

Citation Format(s)

"Will You Get What You Want? Managerial Ties, Knowledge Acquisition, and Firm Performance in China". / Zhong, Weiguo; Yang, Haibin; Wang, Jeff Jianfeng.

Academy of Management 2013 Annual Meeting, AOM 2013. Academy of Management, 2013. p. 1022-1027 (Academy of Management 2013 Annual Meeting, AOM 2013).

Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45)32_Refereed conference paper (with ISBN/ISSN)Not applicablepeer-review