Properties of (K,Na)NbO3-based lead-free piezoelectric films prepared by pulsed laser deposition

Ngeah Theng Chua; Lu You; Jan Ma; Junling Wang

doi:10.1016/j.tsf.2010.06.016

Properties of (K,Na)NbO₃-based lead-free piezoelectric films prepared by pulsed laser deposition

Ngeah Theng Chua, Lu You, Jan Ma, Junling Wang

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

11 Citations (Scopus)

Abstract

To investigate the properties of (K,Na)NbO₃-based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K_0.5Na_0.5)_0.97Li _0.03] (Nb_0.8Ta_0.2)O₃ films on (001), (110) and (111)-oriented single crystal SrTiO₃ substrates by pulsed laser deposition. The structure and electrical properties of the films were studied. Dielectric constants of 540, 390 and 300 and remnant polarizations of 4.00, 1.05, and 0.35 μC/cm² were observed for the (001), (110) and (111) oriented films, respectively. © 2010 Elsevier B.V.

Original language	English
Pages (from-to)	6777-6780
Journal	Thin Solid Films
Volume	518
Issue number	23
DOIs	https://doi.org/10.1016/j.tsf.2010.06.016
Publication status	Published - 30 Sept 2010
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Research Keywords

(K,Na)NbO3
Dielectric properties
Lead-free piezoelectric
Morphotropic phase boundary
X-ray diffraction

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Cite this

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title = "Properties of (K,Na)NbO3-based lead-free piezoelectric films prepared by pulsed laser deposition",

abstract = "To investigate the properties of (K,Na)NbO3-based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K0.5Na0.5)0.97Li 0.03] (Nb0.8Ta0.2)O3 films on (001), (110) and (111)-oriented single crystal SrTiO3 substrates by pulsed laser deposition. The structure and electrical properties of the films were studied. Dielectric constants of 540, 390 and 300 and remnant polarizations of 4.00, 1.05, and 0.35 μC/cm2 were observed for the (001), (110) and (111) oriented films, respectively. {\textcopyright} 2010 Elsevier B.V.",

keywords = "(K,Na)NbO3, Dielectric properties, Lead-free piezoelectric, Morphotropic phase boundary, X-ray diffraction",

author = "Chua, {Ngeah Theng} and Lu You and Jan Ma and Junling Wang",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

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TY - JOUR

T1 - Properties of (K,Na)NbO3-based lead-free piezoelectric films prepared by pulsed laser deposition

AU - Chua, Ngeah Theng

AU - You, Lu

AU - Ma, Jan

AU - Wang, Junling

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2010/9/30

Y1 - 2010/9/30

N2 - To investigate the properties of (K,Na)NbO3-based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K0.5Na0.5)0.97Li 0.03] (Nb0.8Ta0.2)O3 films on (001), (110) and (111)-oriented single crystal SrTiO3 substrates by pulsed laser deposition. The structure and electrical properties of the films were studied. Dielectric constants of 540, 390 and 300 and remnant polarizations of 4.00, 1.05, and 0.35 μC/cm2 were observed for the (001), (110) and (111) oriented films, respectively. © 2010 Elsevier B.V.

AB - To investigate the properties of (K,Na)NbO3-based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K0.5Na0.5)0.97Li 0.03] (Nb0.8Ta0.2)O3 films on (001), (110) and (111)-oriented single crystal SrTiO3 substrates by pulsed laser deposition. The structure and electrical properties of the films were studied. Dielectric constants of 540, 390 and 300 and remnant polarizations of 4.00, 1.05, and 0.35 μC/cm2 were observed for the (001), (110) and (111) oriented films, respectively. © 2010 Elsevier B.V.

KW - (K,Na)NbO3

KW - Dielectric properties

KW - Lead-free piezoelectric

KW - Morphotropic phase boundary

KW - X-ray diffraction

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U2 - 10.1016/j.tsf.2010.06.016

DO - 10.1016/j.tsf.2010.06.016

M3 - RGC 21 - Publication in refereed journal

SN - 0040-6090

VL - 518

SP - 6777

EP - 6780

JO - Thin Solid Films

JF - Thin Solid Films

IS - 23

ER -