Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
---|---|
Pages (from-to) | 604-610 |
Journal / Publication | Applied Surface Science |
Volume | 208-209 |
Issue number | 1 |
Publication status | Published - 15 Mar 2003 |
Externally published | Yes |
Link(s)
Abstract
According to the general formula Pb1-X/2 (Zr0.65 Ti0.35)1-X NbX O3+4mol% PbO excess (X=1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(100) substrates using either a Nd:YAG (355nm) or a XeCl (308nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge. © 2002 Elsevier Science B.V. All rights reserved.
Research Area(s)
- Effective dielectric function, Laser ablation, Optical properties, PZTN film
Citation Format(s)
Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique. / Boerasu, I.; Pereira, M.; Vasilevskiy, M. et al.
In: Applied Surface Science, Vol. 208-209, No. 1, 15.03.2003, p. 604-610.
In: Applied Surface Science, Vol. 208-209, No. 1, 15.03.2003, p. 604-610.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review