Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique

I. Boerasu; M. Pereira; M. Vasilevskiy; M. J M Gomes; B. Watts; F. Leccabue; P. M. Vilarinho

doi:10.1016/S0169-4332(02)01400-9

Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique

I. Boerasu, M. Pereira, M. Vasilevskiy, M. J M Gomes, B. Watts, F. Leccabue, P. M. Vilarinho

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

7 Citations (Scopus)

Abstract

According to the general formula Pb_1-X/2 (Zr_0.65 Ti_0.35)_1-X Nb_X O₃+4mol% PbO excess (X=1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(100) substrates using either a Nd:YAG (355nm) or a XeCl (308nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge. © 2002 Elsevier Science B.V. All rights reserved.

Original language	English
Pages (from-to)	604-610
Journal	Applied Surface Science
Volume	208-209
Issue number	1
DOIs	https://doi.org/10.1016/S0169-4332(02)01400-9
Publication status	Published - 15 Mar 2003
Externally published	Yes

Research Keywords

Effective dielectric function
Laser ablation
Optical properties
PZTN film

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title = "Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique",

abstract = "According to the general formula Pb1-X/2 (Zr0.65 Ti0.35)1-X NbX O3+4mol% PbO excess (X=1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(100) substrates using either a Nd:YAG (355nm) or a XeCl (308nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge. {\textcopyright} 2002 Elsevier Science B.V. All rights reserved.",

keywords = "Effective dielectric function, Laser ablation, Optical properties, PZTN film",

author = "I. Boerasu and M. Pereira and M. Vasilevskiy and Gomes, {M. J M} and B. Watts and F. Leccabue and Vilarinho, {P. M.}",

year = "2003",

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doi = "10.1016/S0169-4332(02)01400-9",

language = "English",

volume = "208-209",

pages = "604--610",

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TY - JOUR

T1 - Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique

AU - Boerasu, I.

AU - Pereira, M.

AU - Vasilevskiy, M.

AU - Gomes, M. J M

AU - Watts, B.

AU - Leccabue, F.

AU - Vilarinho, P. M.

PY - 2003/3/15

Y1 - 2003/3/15

N2 - According to the general formula Pb1-X/2 (Zr0.65 Ti0.35)1-X NbX O3+4mol% PbO excess (X=1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(100) substrates using either a Nd:YAG (355nm) or a XeCl (308nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge. © 2002 Elsevier Science B.V. All rights reserved.

AB - According to the general formula Pb1-X/2 (Zr0.65 Ti0.35)1-X NbX O3+4mol% PbO excess (X=1 and 4%) lead niobium zirconate titanate (PZTN) ferroelectric films were deposited by ablation technique on Pt coated Si, and MgO(100) substrates using either a Nd:YAG (355nm) or a XeCl (308nm) excimer laser. X-ray diffraction was used to determine the crystallographic structure as well as to identify the presence of secondary phases, i.e. non-perovskite phases. The frequency dependent effective dielectric function of PZTN samples produced using different lasers was measured experimentally and modeled. Also, the ferroelectric behaviour of the as-deposited films was studied using a modified Sawyer-Tower bridge. © 2002 Elsevier Science B.V. All rights reserved.

KW - Effective dielectric function

KW - Laser ablation

KW - Optical properties

KW - PZTN film

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U2 - 10.1016/S0169-4332(02)01400-9

DO - 10.1016/S0169-4332(02)01400-9

M3 - RGC 21 - Publication in refereed journal

SN - 0169-4332

VL - 208-209

SP - 604

EP - 610

JO - Applied Surface Science

JF - Applied Surface Science

IS - 1

ER -

Properties of ferroelectric films based on Nb-modified PZT produced by PLD technique

Abstract

Research Keywords

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