Abstract
A multilayer structure of Co/a-Si/Ti/Si(100) together with Co/Ti/Si(100) is applied to investigate the process and mechanism of CoSi2 epitaxial growth on a Si(100) substrate. The experimental results show that by adding an amorphous Si layer with a certain thickness, the epitaxial quality of CoSi2 is significantly improved. A multi-element amorphous layer is formed by a solid state amorphization reaction at the initial stage of the multilayer reaction. This layer acts as a diffusion barrier, which controls the atomic interdiffusion of Co and Si and limits the supply of Co atoms. It has a vital effect on the multilayer reaction kinetics, and the epitaxial growth of CoSi2 on Si. The kinetics of the CoSi2 growth process from multilayer reactions is investigated.
| Original language | English |
|---|---|
| Title of host publication | Nucleation and Growth Processes in Materials |
| Editors | Antonios Gonis, Patrice E. A. Turchi, Alan J. Ardell |
| Publisher | Materials Research Society |
| Pages | 117-122 |
| ISBN (Print) | 9781558994881 |
| DOIs | |
| Publication status | Published - Dec 1999 |
| Event | 1999 MRS Fall Meeting & Exhibit - Boton, United States Duration: 29 Nov 1999 → 3 Dec 1999 https://www.mrs.org/fall1999 |
Publication series
| Name | Materials Research Society Symposium Proceedings |
|---|---|
| Volume | 580 |
| ISSN (Print) | 0272-9172 |
Conference
| Conference | 1999 MRS Fall Meeting & Exhibit |
|---|---|
| Place | United States |
| City | Boton |
| Period | 29/11/99 → 3/12/99 |
| Internet address |
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