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Process and mechanism of CoSi2/Si solid phase epitaxy by multilayer reaction

Bing-Zong Li, Xin-Ping Qu, Guo-Ping Ru, Ning Wang, Paul Chu

    Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

    Abstract

    A multilayer structure of Co/a-Si/Ti/Si(100) together with Co/Ti/Si(100) is applied to investigate the process and mechanism of CoSi2 epitaxial growth on a Si(100) substrate. The experimental results show that by adding an amorphous Si layer with a certain thickness, the epitaxial quality of CoSi2 is significantly improved. A multi-element amorphous layer is formed by a solid state amorphization reaction at the initial stage of the multilayer reaction. This layer acts as a diffusion barrier, which controls the atomic interdiffusion of Co and Si and limits the supply of Co atoms. It has a vital effect on the multilayer reaction kinetics, and the epitaxial growth of CoSi2 on Si. The kinetics of the CoSi2 growth process from multilayer reactions is investigated.

    Original languageEnglish
    Title of host publicationNucleation and Growth Processes in Materials
    EditorsAntonios Gonis, Patrice E. A. Turchi, Alan J. Ardell
    PublisherMaterials Research Society
    Pages117-122
    ISBN (Print)9781558994881
    DOIs
    Publication statusPublished - Dec 1999
    Event1999 MRS Fall Meeting & Exhibit - Boton, United States
    Duration: 29 Nov 19993 Dec 1999
    https://www.mrs.org/fall1999

    Publication series

    NameMaterials Research Society Symposium Proceedings
    Volume580
    ISSN (Print)0272-9172

    Conference

    Conference1999 MRS Fall Meeting & Exhibit
    PlaceUnited States
    CityBoton
    Period29/11/993/12/99
    Internet address

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