Probing the near fields of the super-resolution near-field optical structure

Din Ping Tsai; Wei Chih Lin

doi:10.1063/1.1290692

Probing the near fields of the super-resolution near-field optical structure

Din Ping Tsai, Wei Chih Lin

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

134 Citations (Scopus)

Abstract

Super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm), a promising structure for near-field ultrahigh-density optical data storage, has been studied by a tapping-mode tuning-fork near-field scanning optical microscope in transmission mode. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super-resolution near-field structure. Images of the near-field intensity gradients at different excited laser powers (0.42-2.43 μW) showed that the area of the static evanescent intensity could be stably controlled. The enhancement of the near-field intensity, and the reduction of the focused spot through the super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm) have been observed. © 2000 American Institute of Physics.

Original language	English
Pages (from-to)	1413-1415
Journal	Applied Physics Letters
Volume	77
Issue number	10
DOIs	https://doi.org/10.1063/1.1290692
Publication status	Published - 4 Sept 2000
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

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title = "Probing the near fields of the super-resolution near-field optical structure",

abstract = "Super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm), a promising structure for near-field ultrahigh-density optical data storage, has been studied by a tapping-mode tuning-fork near-field scanning optical microscope in transmission mode. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super-resolution near-field structure. Images of the near-field intensity gradients at different excited laser powers (0.42-2.43 μW) showed that the area of the static evanescent intensity could be stably controlled. The enhancement of the near-field intensity, and the reduction of the focused spot through the super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm) have been observed. {\textcopyright} 2000 American Institute of Physics.",

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AU - Lin, Wei Chih

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

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N2 - Super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm), a promising structure for near-field ultrahigh-density optical data storage, has been studied by a tapping-mode tuning-fork near-field scanning optical microscope in transmission mode. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super-resolution near-field structure. Images of the near-field intensity gradients at different excited laser powers (0.42-2.43 μW) showed that the area of the static evanescent intensity could be stably controlled. The enhancement of the near-field intensity, and the reduction of the focused spot through the super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm) have been observed. © 2000 American Institute of Physics.

AB - Super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm), a promising structure for near-field ultrahigh-density optical data storage, has been studied by a tapping-mode tuning-fork near-field scanning optical microscope in transmission mode. Both propagating and evanescent field intensities were found at the focused spots of the surface of the super-resolution near-field structure. Images of the near-field intensity gradients at different excited laser powers (0.42-2.43 μW) showed that the area of the static evanescent intensity could be stably controlled. The enhancement of the near-field intensity, and the reduction of the focused spot through the super-resolution near-field structure, glass/SiN (170 nm)/Sb (15 nm)/SiN (20 nm) have been observed. © 2000 American Institute of Physics.

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M3 - RGC 21 - Publication in refereed journal

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SP - 1413

EP - 1415

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 10

ER -

Probing the near fields of the super-resolution near-field optical structure

Abstract

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