Preparation and electrical properties of (100) Preferred (Ba,Sr)TiO3 bilayer thin films derived from pulse laser deposition method

S. G. Lu; Philip A. Friddle; Z. K. Xu; G. G. Siu; Haydn Chen; K. H. Wong; C. L. Mak

doi:10.4028/www.scientific.net/KEM.280-283.849

Preparation and electrical properties of (100) Preferred (Ba,Sr)TiO₃ bilayer thin films derived from pulse laser deposition method

S. G. Lu
, Philip A. Friddle
, Z. K. Xu
, G. G. Siu
, Haydn Chen^*
, K. H. Wong
, C. L. Mak

^*Corresponding author for this work

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Abstract

Bilayer Ba_0.6Sr_0.4TiO₃ - Ba_0.4Sr_0.6TiO₃ and Ba_0.4Sr_0.6TiO₃ - Ba_0.6Sr_0.4TiO₃ thin films were deposited on the LaNiO₃-buffered Pt/Ti/SiO₂/Si substrates using pulse laser deposition method. A (100) preferred orientation was obtained. The structure was characterized using x-ray diffraction (XRD) and Raman spectroscopy. The leakage current, and dielectric permittivity versus temperature were characterized. Results indicated that the (100) preferred bilayer structure had less leakage current and smaller loss tangent, which was in favor of enhancing the quality of thin film used as microwave dielectrics. © 2005 Trans Tech Publications Ltd. All Rights Reserved

Original language	English
Pages (from-to)	849-852
Journal	Key Engineering Materials
Volume	280-283
DOIs	https://doi.org/10.4028/www.scientific.net/KEM.280-283.849
Publication status	Published - 2005

Research Keywords

Barium strontium titanate
Preferred orientation
Pulse laser deposition
Thin film

Access Output

10.4028/www.scientific.net/KEM.280-283.849

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@article{5106e229229848b9907a2e31dffcadeb,

title = "Preparation and electrical properties of (100) Preferred (Ba,Sr)TiO3 bilayer thin films derived from pulse laser deposition method",

abstract = "Bilayer Ba0.6Sr0.4TiO3 - Ba0.4Sr0.6TiO3 and Ba0.4Sr0.6TiO3 - Ba0.6Sr0.4TiO3 thin films were deposited on the LaNiO3-buffered Pt/Ti/SiO2/Si substrates using pulse laser deposition method. A (100) preferred orientation was obtained. The structure was characterized using x-ray diffraction (XRD) and Raman spectroscopy. The leakage current, and dielectric permittivity versus temperature were characterized. Results indicated that the (100) preferred bilayer structure had less leakage current and smaller loss tangent, which was in favor of enhancing the quality of thin film used as microwave dielectrics. {\textcopyright} 2005 Trans Tech Publications Ltd. All Rights Reserved",

keywords = "Barium strontium titanate, Preferred orientation, Pulse laser deposition, Thin film",

author = "Lu, \{S. G.\} and Friddle, \{Philip A.\} and Xu, \{Z. K.\} and Siu, \{G. G.\} and Haydn Chen and Wong, \{K. H.\} and Mak, \{C. L.\}",

year = "2005",

doi = "10.4028/www.scientific.net/KEM.280-283.849",

language = "English",

volume = "280-283",

pages = "849--852",

journal = "Key Engineering Materials",

issn = "1013-9826",

publisher = "Trans Tech Publications Ltd.",

}

TY - JOUR

T1 - Preparation and electrical properties of (100) Preferred (Ba,Sr)TiO3 bilayer thin films derived from pulse laser deposition method

AU - Lu, S. G.

AU - Friddle, Philip A.

AU - Xu, Z. K.

AU - Siu, G. G.

AU - Chen, Haydn

AU - Wong, K. H.

AU - Mak, C. L.

PY - 2005

Y1 - 2005

N2 - Bilayer Ba0.6Sr0.4TiO3 - Ba0.4Sr0.6TiO3 and Ba0.4Sr0.6TiO3 - Ba0.6Sr0.4TiO3 thin films were deposited on the LaNiO3-buffered Pt/Ti/SiO2/Si substrates using pulse laser deposition method. A (100) preferred orientation was obtained. The structure was characterized using x-ray diffraction (XRD) and Raman spectroscopy. The leakage current, and dielectric permittivity versus temperature were characterized. Results indicated that the (100) preferred bilayer structure had less leakage current and smaller loss tangent, which was in favor of enhancing the quality of thin film used as microwave dielectrics. © 2005 Trans Tech Publications Ltd. All Rights Reserved

AB - Bilayer Ba0.6Sr0.4TiO3 - Ba0.4Sr0.6TiO3 and Ba0.4Sr0.6TiO3 - Ba0.6Sr0.4TiO3 thin films were deposited on the LaNiO3-buffered Pt/Ti/SiO2/Si substrates using pulse laser deposition method. A (100) preferred orientation was obtained. The structure was characterized using x-ray diffraction (XRD) and Raman spectroscopy. The leakage current, and dielectric permittivity versus temperature were characterized. Results indicated that the (100) preferred bilayer structure had less leakage current and smaller loss tangent, which was in favor of enhancing the quality of thin film used as microwave dielectrics. © 2005 Trans Tech Publications Ltd. All Rights Reserved

KW - Barium strontium titanate

KW - Preferred orientation

KW - Pulse laser deposition

KW - Thin film

UR - https://www.scopus.com/pages/publications/34249654037

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-34249654037&origin=recordpage

U2 - 10.4028/www.scientific.net/KEM.280-283.849

DO - 10.4028/www.scientific.net/KEM.280-283.849

M3 - RGC 21 - Publication in refereed journal

SN - 1013-9826

VL - 280-283

SP - 849

EP - 852

JO - Key Engineering Materials

JF - Key Engineering Materials

ER -