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Predictions for partial-dislocation-mediated processes in nanocrystalline Ni by generalized planar fault energy curves: An experimental evaluation

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Generalized planar fault energy (GPFE) curves have been used to predict partial-dislocation-mediated processes in nanocrystalline materials, but their validity has not been evaluated experimentally. We report experimental observations of a large quantity of both stacking faults and twins in nc Ni deformed at relatively low stresses in a tensile test. The experimental findings indicate that the GPFE curves can reasonably explain the formation of stacking faults, but they alone were not able to adequately predict the propensity of deformation twinning. © 2006 American Institute of Physics.
Original languageEnglish
Article number121905
JournalApplied Physics Letters
Volume88
Issue number12
Online published20 Mar 2006
DOIs
Publication statusPublished - 20 Mar 2006
Externally publishedYes

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