Prediction of magnetic field radiation using equivalent current distribution
Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
| Original language | English |
|---|---|
| Title of host publication | IEEE International Symposium on Electromagnetic Compatibility |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 887-890 |
| Volume | 2015-Septmber |
| ISBN (Print) | 9781479966158 |
| Publication status | Published - 10 Sep 2015 |
Publication series
| Name | |
|---|---|
| Volume | 2015-Septmber |
| ISSN (Print) | 1077-4076 |
| ISSN (Electronic) | 2158-1118 |
Conference
| Title | IEEE International Symposium on Electromagnetic Compatibility, EMC 2015 |
|---|---|
| Place | Germany |
| City | Dresden |
| Period | 16 - 22 August 2015 |
Link(s)
Abstract
Near field measurement has commonly been used as an efficient and effective method for EMC diagnosis purpose for prediction of electromagnetic field radiation in an electronic circuit design; the near field values are obtained on scattered points on the measurement plane. In the paper, we investigated a novel method in predicting the magnetic field radiation using measurement of only a single magnetic field component, by reconstruction of an equivalent current source of the interpolated measurement data. Numerical tests have demonstrated the effectiveness of the proposed method.
Research Area(s)
- current source reconstruction, electromagnetic emission, near field measurement
Citation Format(s)
Prediction of magnetic field radiation using equivalent current distribution. / Diao, Y. L.; Sun, W. N.; Leung, S. W.; Siu, Y. M.; Chan, K. H.
IEEE International Symposium on Electromagnetic Compatibility. Vol. 2015-Septmber Institute of Electrical and Electronics Engineers Inc., 2015. p. 887-890 7256282.Research output: Chapters, Conference Papers, Creative and Literary Works (RGC: 12, 32, 41, 45) › 32_Refereed conference paper (with ISBN/ISSN) › peer-review
