TY - JOUR
T1 - Predicting high temperature mechanical properties of CrN and CrAlN coatings from in-situ synchrotron radiation X-ray diffraction
AU - Mohammadpour, Ehsan
AU - Jiang, Zhong-Tao
AU - Altarawneh, Mohmmednoor
AU - Xie, Zonghan
AU - Zhou, Zhi-Feng
AU - Mondinos, Nicholas
AU - Kimpton, Justin
AU - Dlugogorski, Bogdan Z.
PY - 2016/1/29
Y1 - 2016/1/29
N2 - This contribution investigates the phase composition of CrN and CrAlN coatings by in-situ high temperature synchrotron radiation (SR-XRD), with the coatings deposited on steel substrate by closed field unbalance magnetron sputtering. Rietveld refinement on the SR-XRD spectra indicated CrN as the major phase, over the temperature range of 25 °C - 700 °C, for both coatings. At the high temperature of 700 °C, a Cr2N phase was observed in the CrN coating while the CrAlN coating also had a Cr phase. Williamson-Hall plots, from the refined data, afforded estimating variations of the strain and crystallite size of the major phase, up to 700 °C. The crystallite size (10 nm) for the CrAlN coating, at 25 °C, agrees very well with previous GI-XRD and TEM results obtained at room temperature Li et al. (2012).
AB - This contribution investigates the phase composition of CrN and CrAlN coatings by in-situ high temperature synchrotron radiation (SR-XRD), with the coatings deposited on steel substrate by closed field unbalance magnetron sputtering. Rietveld refinement on the SR-XRD spectra indicated CrN as the major phase, over the temperature range of 25 °C - 700 °C, for both coatings. At the high temperature of 700 °C, a Cr2N phase was observed in the CrN coating while the CrAlN coating also had a Cr phase. Williamson-Hall plots, from the refined data, afforded estimating variations of the strain and crystallite size of the major phase, up to 700 °C. The crystallite size (10 nm) for the CrAlN coating, at 25 °C, agrees very well with previous GI-XRD and TEM results obtained at room temperature Li et al. (2012).
KW - GSASII
KW - Hard coatings
KW - High temperature X-ray diffraction
KW - Rietveld refinement
KW - Strain
KW - Synchrotron radiation
KW - Williamson-Hall
UR - http://www.scopus.com/inward/record.url?scp=84958982878&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84958982878&origin=recordpage
U2 - 10.1016/j.tsf.2015.12.055
DO - 10.1016/j.tsf.2015.12.055
M3 - RGC 21 - Publication in refereed journal
SN - 0040-6090
VL - 599
SP - 98
EP - 103
JO - Thin Solid Films
JF - Thin Solid Films
ER -