Precisely detecting atomic position of atomic intensity images

Zhijun Wang; Yaolin Guo; Sai Tang; Junjie Li; Jincheng Wang; Yaohe Zhou

doi:10.1016/j.ultramic.2014.12.005

Precisely detecting atomic position of atomic intensity images

Zhijun Wang
, Yaolin Guo
, Sai Tang
, Junjie Li
, Jincheng Wang^*
, Yaohe Zhou

^*Corresponding author for this work

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

3 Citations (Scopus)

Abstract

We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.

Original language	English
Pages (from-to)	74-78
Journal	Ultramicroscopy
Volume	150
DOIs	https://doi.org/10.1016/j.ultramic.2014.12.005
Publication status	Published - 1 Mar 2015
Externally published	Yes

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Research Keywords

Atomic intensity image
Atomic position
Strain mapping

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10.1016/j.ultramic.2014.12.005

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@article{c45be949e40b4744af2e6f16c8d0ff6b,

title = "Precisely detecting atomic position of atomic intensity images",

abstract = "We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.",

keywords = "Atomic intensity image, Atomic position, Strain mapping",

author = "Zhijun Wang and Yaolin Guo and Sai Tang and Junjie Li and Jincheng Wang and Yaohe Zhou",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].",

year = "2015",

month = mar,

day = "1",

doi = "10.1016/j.ultramic.2014.12.005",

language = "English",

volume = "150",

pages = "74--78",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Precisely detecting atomic position of atomic intensity images

AU - Wang, Zhijun

AU - Guo, Yaolin

AU - Tang, Sai

AU - Li, Junjie

AU - Wang, Jincheng

AU - Zhou, Yaohe

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2015/3/1

Y1 - 2015/3/1

N2 - We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.

AB - We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.

KW - Atomic intensity image

KW - Atomic position

KW - Strain mapping

UR - https://www.scopus.com/pages/publications/84919950345

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84919950345&origin=recordpage

U2 - 10.1016/j.ultramic.2014.12.005

DO - 10.1016/j.ultramic.2014.12.005

M3 - RGC 21 - Publication in refereed journal

SN - 0304-3991

VL - 150

SP - 74

EP - 78

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -

Precisely detecting atomic position of atomic intensity images

Abstract

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Research Keywords

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