Precisely detecting atomic position of atomic intensity images
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 74-78 |
| Journal / Publication | Ultramicroscopy |
| Volume | 150 |
| Publication status | Published - 1 Mar 2015 |
| Externally published | Yes |
Link(s)
Abstract
We proposed a quantitative method to detect atomic position in atomic intensity images from experiments such as high-resolution transmission electron microscopy, atomic force microscopy, and simulation such as phase field crystal modeling. The evaluation of detection accuracy proves the excellent performance of the method. This method provides a chance to precisely determine atomic interactions based on the detected atomic positions from the atomic intensity image, and hence to investigate the related physical, chemical and electrical properties.
Research Area(s)
- Atomic intensity image, Atomic position, Strain mapping
Bibliographic Note
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Citation Format(s)
Precisely detecting atomic position of atomic intensity images. / Wang, Zhijun; Guo, Yaolin; Tang, Sai et al.
In: Ultramicroscopy, Vol. 150, 01.03.2015, p. 74-78.
In: Ultramicroscopy, Vol. 150, 01.03.2015, p. 74-78.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
