Power Quality Meter and Method of Waveform Analysis and Compression

Research output: Patents, Agreements and Assignments (RGC: 51, 52, 53) › 51_Patents granted (CityU only, data source from KTO)

Overview

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Author(s)

Chung Fai Norman TSE (Inventor)
Wing Hong Ricky LAU (Inventor)

Related Research Unit(s)

Detail(s)

Original language	English
Patent number	US9,170,986
Filing number	12/940,149
Publication status	Accepted/In press/Filed - 5 Nov 2010 Published - 27 Oct 2015

Link(s)

	Check@CityULib
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(5d6efe90-9da5-4b82-8894-47aafffd5b28).html

Citation Format(s)

[ RIS ] [ BibTeX ]

Power Quality Meter and Method of Waveform Analysis and Compression. / TSE, Chung Fai Norman (Inventor); LAU, Wing Hong Ricky (Inventor).

Patent No.: US9,170,986. Oct 27, 2015.

Research output: Patents, Agreements and Assignments (RGC: 51, 52, 53) › 51_Patents granted (CityU only, data source from KTO)

TSE, CFN & LAU, WHR Oct. 27 2015, Power Quality Meter and Method of Waveform Analysis and Compression, Patent No. US9,170,986.

TSE, C. F. N., & LAU, W. H. R. (2015). Power Quality Meter and Method of Waveform Analysis and Compression. (Patent No. US9,170,986).

TSE CFN , LAU WHR, inventors. Power Quality Meter and Method of Waveform Analysis and Compression. US9,170,986. 2015 Oct 27.

TSE, Chung Fai Norman (Inventor) ; LAU, Wing Hong Ricky (Inventor). / Power Quality Meter and Method of Waveform Analysis and Compression. Patent No.: US9,170,986. Oct 27, 2015.