Polycrystalline film target texture and nuclear backscattering analysis

H. H. Andersen, K. N. Tu, J. F. Ziegler

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

16 Citations (Scopus)

Abstract

The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils. © 1978.
Original languageEnglish
Pages (from-to)247-251
JournalNuclear Instruments and Methods
Volume149
Issue number1-3
DOIs
Publication statusPublished - 1978
Externally publishedYes

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