Polarization fatigue in Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 single crystals

Shujun Zhang; Jun Luo; Fei Li; Richard J. Meyer Jr.; Wesley Hackenberger; Thomas R. Shrout

doi:10.1016/j.actamat.2010.03.018

Polarization fatigue in Pb(In_0.5Nb_0.5)O₃-Pb(Mg_1/3Nb _2/3)O₃-PbTiO₃ single crystals

Shujun Zhang, Jun Luo, Fei Li, Richard J. Meyer Jr., Wesley Hackenberger, Thomas R. Shrout

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

52 Citations (Scopus)

Abstract

Electric fatigue tests have been conducted on pure and manganese-modified Pb(In_0.5Nb_0.5)O₃-Pb(Mg_1/3Nb _2/3)O₃-PbTiO₃ (PIN-PMN-PT) single crystals along different crystallographic directions. Polarization degradation was observed to suddenly occur above 50-100 bipolar cycles in 〈1 1 0〉 oriented samples, while 〈0 0 1〉 oriented samples exhibited almost fatigue free characteristics. The fatigue behavior was investigated as a function of orientation, magnitude of the electric field and manganese dopant. It was found that 〈0 0 1〉 oriented PIN-PMN-PT crystals were fatigue free, due to its small domain size, being on the order of 1 μm. The 〈1 1 0〉 direction exhibited a strong electrical fatigue behavior due to mechanical degradation. Micro/macro cracks developed in fatigued 〈1 1 0〉 oriented single crystals. Fatigue and cracks were the result of strong anisotropic piezoelectric stress and non-180° domain switching, which completely locked the non-180° domains. Furthermore, manganese-modified PIN-PMN-PT crystals were found to show improved fatigue behavior due to an enhanced coercive field. © 2010 Acta Materialia Inc.

Original language	English
Pages (from-to)	3773-3780
Journal	Acta Materialia
Volume	58
Issue number	10
DOIs	https://doi.org/10.1016/j.actamat.2010.03.018
Publication status	Published - Jun 2010
Externally published	Yes

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to <a href="mailto:[email protected]">[email protected]</a>.

Funding

The work was supported by the NIH under Grant No. P41-EB21820 and ONR under Grant Nos N00014-07-C-0858 and N00014-09-1-0456. F.L. wishes to acknowledge support from the China Scholarship Council.

Research Keywords

Fatigue
Ferroelectricity
Internal stresses
Perovskite crystal
Piezoelectricity

Access Output

10.1016/j.actamat.2010.03.018

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@article{bd435fe185454503bc836981e502b476,

title = "Polarization fatigue in Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 single crystals",

abstract = "Electric fatigue tests have been conducted on pure and manganese-modified Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 (PIN-PMN-PT) single crystals along different crystallographic directions. Polarization degradation was observed to suddenly occur above 50-100 bipolar cycles in 〈1 1 0〉 oriented samples, while 〈0 0 1〉 oriented samples exhibited almost fatigue free characteristics. The fatigue behavior was investigated as a function of orientation, magnitude of the electric field and manganese dopant. It was found that 〈0 0 1〉 oriented PIN-PMN-PT crystals were fatigue free, due to its small domain size, being on the order of 1 μm. The 〈1 1 0〉 direction exhibited a strong electrical fatigue behavior due to mechanical degradation. Micro/macro cracks developed in fatigued 〈1 1 0〉 oriented single crystals. Fatigue and cracks were the result of strong anisotropic piezoelectric stress and non-180° domain switching, which completely locked the non-180° domains. Furthermore, manganese-modified PIN-PMN-PT crystals were found to show improved fatigue behavior due to an enhanced coercive field. {\textcopyright} 2010 Acta Materialia Inc.",

keywords = "Fatigue, Ferroelectricity, Internal stresses, Perovskite crystal, Piezoelectricity",

author = "Shujun Zhang and Jun Luo and Fei Li and {Meyer Jr.}, {Richard J.} and Wesley Hackenberger and Shrout, {Thomas R.}",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to <a href={"}mailto:[email protected]{"}>[email protected]</a>.",

year = "2010",

month = jun,

doi = "10.1016/j.actamat.2010.03.018",

language = "English",

volume = "58",

pages = "3773--3780",

journal = "Acta Materialia",

issn = "1359-6454",

publisher = "Elsevier Ltd.",

number = "10",

}

TY - JOUR

T1 - Polarization fatigue in Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 single crystals

AU - Zhang, Shujun

AU - Luo, Jun

AU - Li, Fei

AU - Meyer Jr., Richard J.

AU - Hackenberger, Wesley

AU - Shrout, Thomas R.

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to <a href="mailto:[email protected]">[email protected]</a>.

PY - 2010/6

Y1 - 2010/6

N2 - Electric fatigue tests have been conducted on pure and manganese-modified Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 (PIN-PMN-PT) single crystals along different crystallographic directions. Polarization degradation was observed to suddenly occur above 50-100 bipolar cycles in 〈1 1 0〉 oriented samples, while 〈0 0 1〉 oriented samples exhibited almost fatigue free characteristics. The fatigue behavior was investigated as a function of orientation, magnitude of the electric field and manganese dopant. It was found that 〈0 0 1〉 oriented PIN-PMN-PT crystals were fatigue free, due to its small domain size, being on the order of 1 μm. The 〈1 1 0〉 direction exhibited a strong electrical fatigue behavior due to mechanical degradation. Micro/macro cracks developed in fatigued 〈1 1 0〉 oriented single crystals. Fatigue and cracks were the result of strong anisotropic piezoelectric stress and non-180° domain switching, which completely locked the non-180° domains. Furthermore, manganese-modified PIN-PMN-PT crystals were found to show improved fatigue behavior due to an enhanced coercive field. © 2010 Acta Materialia Inc.

AB - Electric fatigue tests have been conducted on pure and manganese-modified Pb(In0.5Nb0.5)O3-Pb(Mg1/3Nb 2/3)O3-PbTiO3 (PIN-PMN-PT) single crystals along different crystallographic directions. Polarization degradation was observed to suddenly occur above 50-100 bipolar cycles in 〈1 1 0〉 oriented samples, while 〈0 0 1〉 oriented samples exhibited almost fatigue free characteristics. The fatigue behavior was investigated as a function of orientation, magnitude of the electric field and manganese dopant. It was found that 〈0 0 1〉 oriented PIN-PMN-PT crystals were fatigue free, due to its small domain size, being on the order of 1 μm. The 〈1 1 0〉 direction exhibited a strong electrical fatigue behavior due to mechanical degradation. Micro/macro cracks developed in fatigued 〈1 1 0〉 oriented single crystals. Fatigue and cracks were the result of strong anisotropic piezoelectric stress and non-180° domain switching, which completely locked the non-180° domains. Furthermore, manganese-modified PIN-PMN-PT crystals were found to show improved fatigue behavior due to an enhanced coercive field. © 2010 Acta Materialia Inc.

KW - Fatigue

KW - Ferroelectricity

KW - Internal stresses

KW - Perovskite crystal

KW - Piezoelectricity

UR - http://www.scopus.com/inward/record.url?scp=77951286458&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-77951286458&origin=recordpage

U2 - 10.1016/j.actamat.2010.03.018

DO - 10.1016/j.actamat.2010.03.018

M3 - RGC 21 - Publication in refereed journal

C2 - 20652090

SN - 1359-6454

VL - 58

SP - 3773

EP - 3780

JO - Acta Materialia

JF - Acta Materialia

IS - 10

ER -