TY - JOUR
T1 - Planning and optimizing environmental stress screening
AU - Mok, Y. L.
AU - Xie, M.
PY - 1996
Y1 - 1996
N2 - Environmental Stress Screening (ESS) is widely used in the electronics industries as a means to remove early failures. It is a process that calls for proper planning as inadequate duration is ineffective while prolonged screening can incur unnecessary cost. This note describes an approach utilizing mathematical programming to ensure that the right amount of screening is in place at each assembly level. The factors considered include the screening cost and desired operational reliability.
AB - Environmental Stress Screening (ESS) is widely used in the electronics industries as a means to remove early failures. It is a process that calls for proper planning as inadequate duration is ineffective while prolonged screening can incur unnecessary cost. This note describes an approach utilizing mathematical programming to ensure that the right amount of screening is in place at each assembly level. The factors considered include the screening cost and desired operational reliability.
UR - http://www.scopus.com/inward/record.url?scp=0029753291&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0029753291&origin=recordpage
U2 - 10.1109/RAMS.1996.500662
DO - 10.1109/RAMS.1996.500662
M3 - RGC 22 - Publication in policy or professional journal
SN - 0149-144X
SP - 191
EP - 198
JO - Proceedings of the Annual Reliability and Maintainability Symposium
JF - Proceedings of the Annual Reliability and Maintainability Symposium
T2 - Proceedings of the 1996 Annual Reliability and Maintainability
Y2 - 22 January 1996 through 25 January 1996
ER -