Planar Defects in Thin Films of InGaN

Z. Liliental-Weber; D. Zakharov; K. M. Yu; S. Bedair

doi:10.1017/S1431927612009282

Planar Defects in Thin Films of InGaN

Z. Liliental-Weber
, D. Zakharov
, K. M. Yu
, S. Bedair

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Original language	English
Pages (from-to)	1486-1487
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612009282
Publication status	Published - Jul 2012
Externally published	Yes

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@article{e391507220ce4c75abb86cfbc1596b67,

title = "Planar Defects in Thin Films of InGaN",

author = "Z. Liliental-Weber and D. Zakharov and Yu, \{K. M.\} and S. Bedair",

year = "2012",

month = jul,

doi = "10.1017/S1431927612009282",

language = "English",

volume = "18",

pages = "1486--1487",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S2",

}

TY - JOUR

T1 - Planar Defects in Thin Films of InGaN

AU - Liliental-Weber, Z.

AU - Zakharov, D.

AU - Yu, K. M.

AU - Bedair, S.

PY - 2012/7

Y1 - 2012/7

UR - https://www.scopus.com/pages/publications/85008536233

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85008536233&origin=recordpage

U2 - 10.1017/S1431927612009282

DO - 10.1017/S1431927612009282

M3 - RGC 21 - Publication in refereed journal

SN - 1431-9276

VL - 18

SP - 1486

EP - 1487

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Planar Defects in Thin Films of InGaN

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