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Piezoelectric structural sensor technology for extreme environments

  • Michael Ian Lapsley
  • , Edward F. Alberta
  • , Raffi Sahul
  • , Wesley Hackenberger
  • , Xiaoning Jiang
  • , Shujun Zhang
  • , Thomas Shrout

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

High temperature sensors are desired for down-hole well monitoring, future propulsion components, as well as improving performance and maintainability of power production facilities and other rotary combustion engines. Recently discovered high temperature oxyborate crystals showed stable piezoelectric properties and high resistivity at temperatures close to its melting point (∼ 1500°C, or 2730°F), which is very promising for high temperature sensor applications. In this paper the feasibility of using oxyborate based high temperature piezoelectric crystal (HTPC) for high temperature piezoelectric sensor applications is demonstrated. Oxyborate HTPC with various crystal cuts and vibration modes were investigated to obtain high temperature resistivity, dielectric, piezoelectric and thermal expansion properties. YCa 4O(BO3)3 crystals (YCOB) showed excellent piezoelectricity, low dielectric loss and high resistivity at temperatures up to 1000°C (> 1800°F). The measured thermal expansion coefficients of YCOB are about ∼3-8 ppm/K, depending on different orientations. High temperature accelerometers were demonstrated using YCOB HTPC at temperatures up to 1000°C with sensitivity remaining steady (∼ 2.4 pC/g) across the temperature range of 20°C - 1000°C.
Original languageEnglish
Title of host publicationInternational Conference and Exhibition on High Temperature Electronics 2010, HiTEC 2010
Pages355-358
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventIMAPS High Temperature Electronics Conference, HiTEC 2010 - Albuquerque, NM, United States
Duration: 11 May 201013 May 2010

Publication series

NameInternational Conference and Exhibition on High Temperature Electronics 2010, HiTEC 2010

Conference

ConferenceIMAPS High Temperature Electronics Conference, HiTEC 2010
PlaceUnited States
CityAlbuquerque, NM
Period11/05/1013/05/10

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

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