Abstract
This work presents a detailed analysis of the high-frequency class E amplifier realized using MOS transistor with particular attention on the effects of the nonlinear junction capacitance in the drain region. To enable analytical analysis and for easy of circuit design, the junction capacitance is approximated using piece-wise linear functions. Results show that this treatment is accurate enough and the amplifier characteristics calculated with the newly developed design formulae agree very well with those of the Pspice simulation.
| Original language | English |
|---|---|
| Title of host publication | 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 |
| Publisher | IEEE |
| Pages | 233-236 |
| ISBN (Print) | 0780377494, 9780780377493 |
| DOIs | |
| Publication status | Published - 2003 |
| Event | 2003 IEEE Conference on Electron Devices and Solid-State Circuits - New World Renaissance Hotel, Hong Kong, China Duration: 16 Dec 2003 → 18 Dec 2003 |
Conference
| Conference | 2003 IEEE Conference on Electron Devices and Solid-State Circuits |
|---|---|
| Place | Hong Kong, China |
| Period | 16/12/03 → 18/12/03 |
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