Abstract
Photoreflectance (PR) spectroscopy has been used to study the Fermi-level pinning position of chemically modified (100) GaAs surfaces. It is shown that there are two pinning positions for the unmodified (100) GaAs surface. For n-GaAs the Fermi level pins near midgap, while for p-GaAs the Fermi level pins near the valence band. We used an Ar/Cl plasma generated by an electron-cyclotron resonance (ECR) source and P2S5 chemical passivation to change the stoichiometry of the surface. We show that ECR etching makes the surface oxide As rich and that the Fermi-level position for this circumstance is near midgap. The P2S5 passivation produces a thin Ga rich oxide which is observed to pin the Feimi-level near the valence band. These results allow us to relate the Fermi-level pinning position to the stoichiometry of the GaAs/oxide interface.
| Original language | English |
|---|---|
| Pages (from-to) | 96-102 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 2141 |
| DOIs | |
| Publication status | Published - 26 May 1994 |
| Externally published | Yes |
| Event | Spectroscopic Characterization Techniques for Semiconductor Technology V 1994 - Los Angeles, United States Duration: 23 Jan 1994 → 29 Jan 1994 |
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