TY - JOUR
T1 - Photon scanning tunneling microscope study of optical waveguides
AU - Tsai, Din Ping
AU - Jackson, Howard E.
AU - Reddick, R. C.
AU - Sharp, S. H.
AU - Warmack, R. J.
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 1990
Y1 - 1990
N2 - A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.
AB - A novel technique, photon scanning microscopy, is shown to probe directly the evanescent field outside a planar and a channel waveguide. The decay lengths for these evanescent fields were measured and correspond well to the decay lengths of the evanescent fields calculated for each structure. Two-dimensional scanning at constant intensity or constant height reveals lateral variations in these fields due to topographic changes, index of refraction inhomogeneities, or modal variations within the waveguide.
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U2 - 10.1063/1.103160
DO - 10.1063/1.103160
M3 - RGC 21 - Publication in refereed journal
SN - 0003-6951
VL - 56
SP - 1515
EP - 1517
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 16
ER -