TY - JOUR
T1 - Photoelectrochemical Properties of GaN Photoanodes with Cobalt Phosphate Catalyst for Solar Water Splitting in Neutral Electrolyte
AU - Kamimura, Jumpei
AU - Bogdanoff, Peter
AU - Abdi, Fatwa F.
AU - Lähnemann, Jonas
AU - Van De Krol, Roel
AU - Riechert, Henning
AU - Geelhaar, Lutz
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2017/6/15
Y1 - 2017/6/15
N2 - Cyclic voltammetry measurements are carried out in neutral phosphate-buffered electrolyte using n-type Ga-polar GaN thin-film photoelectrodes with and without cobalt phosphate (Co-Pi) modification. Without Co-Pi, the variation of the photocurrent with the bias potential exhibits a two-step behavior and under chopped illumination spikes occur at low bias potential. Thus in this regime surface recombination is dominant. Co-Pi modification suppresses surface recombination and significantly increases the photocurrent, especially for low bias potentials. At the same time, stability tests reveal that Co-Pi does not protect GaN against photocorrosion. Experiments using H2O2 imply that this photocorrosion is a reductive process and probably related to the presence of charged surface defects. (Graph Presented). © 2017 American Chemical Society.
AB - Cyclic voltammetry measurements are carried out in neutral phosphate-buffered electrolyte using n-type Ga-polar GaN thin-film photoelectrodes with and without cobalt phosphate (Co-Pi) modification. Without Co-Pi, the variation of the photocurrent with the bias potential exhibits a two-step behavior and under chopped illumination spikes occur at low bias potential. Thus in this regime surface recombination is dominant. Co-Pi modification suppresses surface recombination and significantly increases the photocurrent, especially for low bias potentials. At the same time, stability tests reveal that Co-Pi does not protect GaN against photocorrosion. Experiments using H2O2 imply that this photocorrosion is a reductive process and probably related to the presence of charged surface defects. (Graph Presented). © 2017 American Chemical Society.
UR - http://www.scopus.com/inward/record.url?scp=85021297758&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85021297758&origin=recordpage
U2 - 10.1021/acs.jpcc.7b02253
DO - 10.1021/acs.jpcc.7b02253
M3 - RGC 21 - Publication in refereed journal
SN - 1932-7447
VL - 121
SP - 12540
EP - 12545
JO - The Journal of Physical Chemistry C
JF - The Journal of Physical Chemistry C
IS - 23
ER -