Phase tomography reconstructed by 3D TIE in hard X-ray microscope

X-ray phase tomography and phase imaging are promising ways of investigation on low Z material. A polymer blend of PE/PS sample was used to test the 3D phase retrieval method in the parallel beam illuminated microscope. Because the polymer sample is thick, the phase retardation is quite mixed and the image can not be distinguished when the 2D transport intensity equation (TIE) is applied. In this study, we have provided a different approach for solving the phase in three dimensions for thick sample. Our method involves integration of 3D TIE/Fourier slice theorem for solving thick phase sample. In our experiment, eight sets of de-focal series image data sets were recorded covering the angular range of 0 to 180 degree. Only three set of image cubes were used in 3D TIE equation for solving the phase tomography. The phase contrast of the polymer blend in 3D is obviously enhanced, and the two different groups of polymer blend can be distinguished in the phase tomography.