Abstract
Evidence is presented for phase separation in In0.27Ga0.73N/GaN multiple quantum wells (MQW's). After annealing for 4 min at a temperature of 1100 °C, the absorption threshold at 2.95 eV is replaced by a broad peak at 2.65 eV. This peak is attributed to the formation of In-rich InGaN phases in the active region. X-ray diffraction measurements show a shift in the diffraction peaks toward GaN, consistent with the formation of an In-poor phase.
| Original language | English |
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| Pages (from-to) | 985-989 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 482 |
| DOIs | |
| Publication status | Published - 1997 |
| Externally published | Yes |
| Event | Proceedings of the 1997 MRS Fall Meeting - Boston, MA, USA Duration: 1 Dec 1997 → 4 Dec 1997 |