Abstract
This paper presents experimental results showing reduced phase noise in a very high frequency band microelectromechanical systems (MEMS) oscillator. This has been achieved by engineering the embedded MEMS resonator with phononic crystal structures. The aluminum nitride on silicon MEMS resonator with phononic crystal tethers achieves an unloaded quality factor (Qu) 2.3 times of the same resonator with a simple tether design. The increase in Qu leads to a measured 6dB close-to-carrier phase noise reduction in an MEMS-based oscillator that sustained by a transimpedance amplifier implemented in 65nm CMOS process. The 141 MHz MEMS-CMOS oscillator with phononic crystal tethers has a phase noise better than-83dBc/Hz at 1 kHz offset and-134dBc/Hz at the far-from-carrier range while consuming less than 3mW.
| Original language | English |
|---|---|
| Article number | 7400895 |
| Pages (from-to) | 149-154 |
| Journal | IEEE Journal of the Electron Devices Society |
| Volume | 4 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 May 2016 |
Research Keywords
- Microelectromechanical Systems (MEMS),
- oscillator
- phase noise
- phononic crystal
- quality factor
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