@inbook{b0ebe9b66deb46798162a4ff4ee71a22,
title = "Perovskite-based X-ray detectors",
abstract = "X-ray flat-panel detectors play an irreplaceable role in medical diagnostics, security screening, non-destructive testing, and scientific research. Detectors with higher resolution are crucial for more detailed image. Semiconductor-based direct detectors effectively circumvent the optical crosstalk issues in traditional indirect detectors, enabling high-resolution imaging. Perovskite materials have emerged as excellent candidates for high resolution X-ray detectors due to their high X-ray absorption ability, high charge transport ability and low-cost scalability in large area fabrication. Current progress of perovskite-based X-ray detectors is reviewed. Despite their advantages, previously reported perovskite-based X-ray detectors exhibited spatial resolutions failing to surpass scintillator-based systems, with significant discrepancies from the theoretical resolution. To explain this phenomenon, the key figures of merit and how they influence imaging quality will be explained. For further development of perovskite-based X-ray detectors, the designing principles toward high resolution are discussed. Copyright {\textcopyright} 2025. Published by Elsevier Inc.",
keywords = "Perovskite, Resolution, X-ray detector",
author = "Zihao Song and Guangda Niu",
year = "2025",
doi = "10.1016/bs.semsem.2025.09.002",
language = "English",
isbn = "978-0-443-29782-3",
volume = "120",
series = "Semiconductors and Semimetals",
publisher = "Academic Press Inc.",
pages = "65--103",
editor = "Heping Shen",
booktitle = "Semiconductors and Semimetals",
address = "United States",
}