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Patterned growth of vertically aligned silicon nanowire arrays for label-free DNA detection using surface-enhanced Raman spectroscopy

  • Changqing Yi
  • , Cheuk-Wing Li
  • , Huayang Fu
  • , Mingliang Zhang
  • , Suijian Qi
  • , Ning-Bew Wong
  • , Shuit-Tong Lee
  • , Mengsu Yang

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Patterning is of paramount importance in many areas of modern science and technology. As a good candidate for novel nanoscale optoelectronics and miniaturized molecule sensors, vertically aligned silicon nanowire (SiNW) with controllable location and orientation is highly desirable. In this study, we developed an effective procedure for the fabrication of vertically aligned SiNW arrays with micro-sized features by using single-step photolithography and silver nanoparticle-induced chemical etching at room temperature. We demonstrated that the vertically aligned SiNW arrays can be used as a platform for label-free DNA detection using surface-enhanced Raman spectroscopy (SERS), where the inherent "fingerprint" SERS spectra allows for the differentiation of closely related biospecies. Since the SiNW array patterns could be modified by simply varying the mask used in the photolithographic processing, it is expected that the methodology can be used to fabricate label-free DNA microarrays and may be applicable to tissue engineering, which aims to create living tissue substitutes from cells seeded onto 3D scaffolds. © 2010 Springer-Verlag.
Original languageEnglish
Pages (from-to)3143-3150
JournalAnalytical and Bioanalytical Chemistry
Volume397
Issue number7
DOIs
Publication statusPublished - Aug 2010

Research Keywords

  • Silicon nanowire
  • Single-step photolithography
  • Surface-enhanced Raman spectroscopy

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