@inproceedings{55957bb5672c43f98a3d81d36d3ce795,
title = "Optimum instrumentation of a tapping mode, non-optically regulated near-field scanning optical microscope and its applications",
abstract = "We describe the optimum design of the near-field scanning optical microscope (NSOM) based on a short probe tapping mode tuning-fork (TMTF) configuration and its applications in optoelectronic characterization and optical measurements. The short probe TMTF-NSOM is constructed to operate both in collection and excitation modes, in which a cleaved short fiber probe attached to one tine of the tuning fork is used as the light collector/emitter as well as the force sensing element. Interference fringes due to standing evanescent waves generated by total internal reflection are imaged by collection mode. On the other hand, excitation mode of short probe TMTF-NSOM is applied to perform near-field surface photovoltage measurements on AlGaInP light emitting diode structures.",
keywords = "Evanescent field, Near-field scanning optical microscope, Short probe, Surface photovoltage, Tapping-mode, Total internal reflection, Tuning fork",
author = "Lu, \{Nien Hua\} and Chang, \{Yu Min\} and Tsai, \{Din Ping\}",
year = "2005",
doi = "10.1117/12.612255",
language = "English",
series = "Proceedings of SPIE",
publisher = "SPIE",
editor = "Heidi Ottevaere and Peter DeWolf and Wiersma, \{Diederik S.\}",
booktitle = "Nano- and Micro-Metrology",
address = "United States",
note = "Optical Metrology 2005 ; Conference date: 13-06-2005 Through 17-06-2005",
}