Optimization of the burn-in times through redundancy allocation
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the Industrial Engineering Research Conference |
| Publisher | Publ by IIE |
| Pages | 579-583 |
| ISBN (print) | 898061326 |
| Publication status | Published - 1993 |
| Externally published | Yes |
Conference
| Title | Proceedings of the 2nd Industrial Engineering Research Conference |
|---|---|
| City | Los Angeles, CA, USA |
| Period | 26 - 28 May 1993 |
Link(s)
Abstract
Burn-in is a technique widely used by the semiconductor industry to weed out potential defects. Since incompatibility exists not only at the component level but also at the subsystem and the system level, the system reliability after burn-in is usually less than what was forecasted. Compatibility factors are introduced in [1] to deal with this phenomenon. Recently, a high system reliability is required by many manufacturers. To achieve 0.999994 system reliability, we have to use burn-in as well as redundancy allocation. This paper introduces the revised algorithm to solve a mix-integer nonlinear program proposed in [2] which incorporates all level burn-in, redundancy allocation, and the compatibility factors.
Citation Format(s)
Optimization of the burn-in times through redundancy allocation. / Chien, Wei Ting Kary; Kuo, Way.
Proceedings of the Industrial Engineering Research Conference. Publ by IIE, 1993. p. 579-583.
Proceedings of the Industrial Engineering Research Conference. Publ by IIE, 1993. p. 579-583.
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
