Abstract
This paper proposes an optimal defect shape to increase the sensitivity of a MEMS cantilever based piezo resistive sensor. This work describes the sensitivity improvement using Stress concentration region (SCR) introduced in the cantilever beam. The SCR improves the surface stress on the cantilever beam and enhances the sensitivity of the sensor. A particular defect (sigma star) is introduced which is designed and place in a way that increases the sensitivity by about 20%.
Original language | English |
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Title of host publication | 2016 2nd International Conference on Robotics and Artificial Intelligence, ICRAI 2016 |
Publisher | IEEE |
Pages | 136-140 |
ISBN (Print) | 9781509040599 |
DOIs | |
Publication status | Published - 19 Dec 2016 |
Event | 2nd International Conference on Robotics and Artificial Intelligence, ICRAI 2016 - Islamabad, Pakistan Duration: 1 Nov 2016 → 2 Nov 2016 http://www.icrai.com |
Publication series
Name | International Conference on Robotics and Artificial Intelligence |
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Publisher | IEEE |
ISSN (Print) | 2374-0175 |
Conference
Conference | 2nd International Conference on Robotics and Artificial Intelligence, ICRAI 2016 |
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Country/Territory | Pakistan |
City | Islamabad |
Period | 1/11/16 → 2/11/16 |
Internet address |
Research Keywords
- Finite Element Analysis
- MEMS
- Optimal Sensor
- Stress Concentration region