TY - GEN
T1 - Optimal Multi-Type Component Reassignment Design under Internal Degradation and External Shocks
AU - Lei, JZ
AU - Ling, CY
AU - Xie, M
AU - Kuo, W
PY - 2023
Y1 - 2023
N2 - This paper investigates the multi-Type component reassignment problem (MCRP) in consideration of internal degradation and external shocks. First, the hybrid shock arrival model with Wiener process distributed internal degeneration path is demonstrated. Then, we propose a unification method that converts the hybrid shock model into an equivalent single shock model by introducing the concept of statistical virtual shock. To dynamically maximize the system reliability, we construct the optimization model to determine the reassignment time and strategy. The case study verifies the power of reassignment as well as the efficiency of the proposed unification algorithm. © 2023 IEEE.
AB - This paper investigates the multi-Type component reassignment problem (MCRP) in consideration of internal degradation and external shocks. First, the hybrid shock arrival model with Wiener process distributed internal degeneration path is demonstrated. Then, we propose a unification method that converts the hybrid shock model into an equivalent single shock model by introducing the concept of statistical virtual shock. To dynamically maximize the system reliability, we construct the optimization model to determine the reassignment time and strategy. The case study verifies the power of reassignment as well as the efficiency of the proposed unification algorithm. © 2023 IEEE.
KW - component assignment
KW - external shocks
KW - internal degradation
KW - Markov chain
KW - Wiener process
UR - http://www.scopus.com/inward/record.url?scp=85153176687&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85153176687&origin=recordpage
U2 - 10.1109/RAMS51473.2023.10088280
DO - 10.1109/RAMS51473.2023.10088280
M3 - RGC 32 - Refereed conference paper (with host publication)
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - 2023 Annual Reliability and Maintainability Symposium (RAMS)
PB - IEEE
T2 - 2023 Annual Reliability and Maintainability Symposium, RAMS 2023
Y2 - 23 January 2023 through 26 January 2023
ER -