Abstract
PZT 65/35 thin films were deposited on Pt-coated Si (100) and MgO (110) substrates using the sol-gel technique. The crystalline structure of the films was investigated by X-ray diffraction and Raman spectroscopy. Results of measurements and modeling of the optical spectra for the PZT films on MgO substrates are reported. The effective dielectric function is calculated versus frequency and Gaussian tail of the join density of states under the assumption of direct band to band transition. © 2002 Taylor and Francis.
| Original language | English |
|---|---|
| Pages (from-to) | 187-192 |
| Journal | Ferroelectrics |
| Volume | 268 |
| DOIs | |
| Publication status | Published - 1 Jan 2002 |
| Externally published | Yes |
Research Keywords
- Dielectric function
- Optical properties
- PZT films
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