Abstract
A simple approach is developed to identify the layer number of 2D MoS2 sheets. By using an optical imaging method combined with image analysis software, a high-contrast image of the MoS2 sheets can be extracted from the red (R) channel of the color optical microscopy image. The value of the intensity difference in the grayscale image of the R channel between MoS2 sheets (1-3 layers) and the SiO2 substrate can be used to identify the layer number of the sheet. Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
| Original language | English |
|---|---|
| Pages (from-to) | 682-686 |
| Journal | Small |
| Volume | 8 |
| Issue number | 5 |
| Online published | 5 Jan 2012 |
| DOIs | |
| Publication status | Published - 12 Mar 2012 |
| Externally published | Yes |
Research Keywords
- atomic force microscopy
- chalcogenides
- layered materials
- optical imaging
- Raman spectroscopy
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