On the use of atomic force microscopy for structural mapping of metallic-glass thin films
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 121-127 |
| Journal / Publication | Intermetallics |
| Volume | 44 |
| Publication status | Published - 2014 |
Link(s)
Abstract
In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra. © 2013 Elsevier Ltd. All rights reserved.
Research Area(s)
- B. Glasses, metallic, B. Internal friction, B. Surface properties, F. Scanning tunneling electron microscopy, including atomic force microscopy
Citation Format(s)
On the use of atomic force microscopy for structural mapping of metallic-glass thin films. / Zeng, J. F.; Chu, J. P.; Chen, Y. C. et al.
In: Intermetallics, Vol. 44, 2014, p. 121-127.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
