On the use of atomic force microscopy for structural mapping of metallic-glass thin films

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

14 Scopus Citations
View graph of relations

Author(s)

  • J. F. Zeng
  • J. P. Chu
  • Y. C. Chen
  • A. Volland
  • J. J. Blandin
  • S. Gravier

Detail(s)

Original languageEnglish
Pages (from-to)121-127
Journal / PublicationIntermetallics
Volume44
Publication statusPublished - 2014

Abstract

In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra. © 2013 Elsevier Ltd. All rights reserved.

Research Area(s)

  • B. Glasses, metallic, B. Internal friction, B. Surface properties, F. Scanning tunneling electron microscopy, including atomic force microscopy

Citation Format(s)

On the use of atomic force microscopy for structural mapping of metallic-glass thin films. / Zeng, J. F.; Chu, J. P.; Chen, Y. C.; Volland, A.; Blandin, J. J.; Gravier, S.; Yang, Y.

In: Intermetallics, Vol. 44, 2014, p. 121-127.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review