TY - JOUR
T1 - On the use of atomic force microscopy for structural mapping of metallic-glass thin films
AU - Zeng, J. F.
AU - Chu, J. P.
AU - Chen, Y. C.
AU - Volland, A.
AU - Blandin, J. J.
AU - Gravier, S.
AU - Yang, Y.
PY - 2014
Y1 - 2014
N2 - In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra. © 2013 Elsevier Ltd. All rights reserved.
AB - In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra. © 2013 Elsevier Ltd. All rights reserved.
KW - B. Glasses, metallic
KW - B. Internal friction
KW - B. Surface properties
KW - F. Scanning tunneling electron microscopy, including atomic force microscopy
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U2 - 10.1016/j.intermet.2013.09.006
DO - 10.1016/j.intermet.2013.09.006
M3 - RGC 21 - Publication in refereed journal
SN - 0966-9795
VL - 44
SP - 121
EP - 127
JO - Intermetallics
JF - Intermetallics
ER -