On the use of atomic force microscopy for structural mapping of metallic-glass thin films

J. F. Zeng, J. P. Chu, Y. C. Chen, A. Volland, J. J. Blandin, S. Gravier, Y. Yang

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

23 Citations (Scopus)

Abstract

In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra. © 2013 Elsevier Ltd. All rights reserved.
Original languageEnglish
Pages (from-to)121-127
JournalIntermetallics
Volume44
DOIs
Publication statusPublished - 2014

Research Keywords

  • B. Glasses, metallic
  • B. Internal friction
  • B. Surface properties
  • F. Scanning tunneling electron microscopy, including atomic force microscopy

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