On the nitridation-induced enhancement and degradation of MOSFET characteristics

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Original languageEnglish
Pages (from-to)1107-1109
Journal / PublicationSolid State Electronics
Volume33
Issue number8
Publication statusPublished - Aug 1990
Externally publishedYes