On the I/O Cost of Linear Repair Schemes for Arbitrary (n,k) Reed-Solomon Codes

Wenhao Liu; Zhengyi Jiang; Zhongyi Huang; Linqi Song; Hanxu Hou

doi:10.1109/ITW61385.2024.10806986

On the I/O Cost of Linear Repair Schemes for Arbitrary (n,k) Reed-Solomon Codes

Wenhao Liu, Zhengyi Jiang, Zhongyi Huang, Linqi Song^*, Hanxu Hou^*

^*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Abstract

The I/O cost, i.e., the total number of symbols to be read during the single node failure/repair process in a distributed storage system, is one of the most important metrics in repairing Reed-Solomon (RS) codes by the linear repair scheme. In this paper, we construct a linear repair scheme that is applicable to arbitrary (n, k) RS codes. We show that most existing repair schemes of RS codes can be viewed as a special case of our repair scheme. © 2024 IEEE.

Original language	English
Title of host publication	2024 IEEE Information Theory Workshop (ITW)
Publisher	IEEE
Pages	253-258
ISBN (Electronic)	979-8-3503-4893-4
DOIs	https://doi.org/10.1109/ITW61385.2024.10806986
Publication status	Published - 2024
Event	2024 IEEE Information Theory Workshop (ITW'24) - Sheraton Shenzhen Nanshan Hotel, Shenzhen, China Duration: 24 Nov 2024 → 28 Nov 2024 https://www.ieee-itw2024.org/ https://ieee-itw2024.org/

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Name	IEEE Information Theory Workshop, ITW

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Conference	2024 IEEE Information Theory Workshop (ITW'24)
Place	China
City	Shenzhen
Period	24/11/24 → 28/11/24
Internet address	https://www.ieee-itw2024.org/ https://ieee-itw2024.org/

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10.1109/ITW61385.2024.10806986

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@inproceedings{2971a42f7612459ca2d1670d40588d95,

title = "On the I/O Cost of Linear Repair Schemes for Arbitrary (n,k) Reed-Solomon Codes",

abstract = "The I/O cost, i.e., the total number of symbols to be read during the single node failure/repair process in a distributed storage system, is one of the most important metrics in repairing Reed-Solomon (RS) codes by the linear repair scheme. In this paper, we construct a linear repair scheme that is applicable to arbitrary (n, k) RS codes. We show that most existing repair schemes of RS codes can be viewed as a special case of our repair scheme. {\textcopyright} 2024 IEEE.",

author = "Wenhao Liu and Zhengyi Jiang and Zhongyi Huang and Linqi Song and Hanxu Hou",

year = "2024",

doi = "10.1109/ITW61385.2024.10806986",

language = "English",

series = "IEEE Information Theory Workshop, ITW",

publisher = "IEEE",

pages = "253--258",

booktitle = "2024 IEEE Information Theory Workshop (ITW)",

address = "United States",

note = "2024 IEEE Information Theory Workshop (ITW'24) ; Conference date: 24-11-2024 Through 28-11-2024",

url = "https://www.ieee-itw2024.org/, https://ieee-itw2024.org/",

}

On the I/O Cost of Linear Repair Schemes for Arbitrary (n,k) Reed-Solomon Codes. / Liu, Wenhao; Jiang, Zhengyi; Huang, Zhongyi et al.
2024 IEEE Information Theory Workshop (ITW). IEEE, 2024. p. 253-258 (IEEE Information Theory Workshop, ITW).

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - On the I/O Cost of Linear Repair Schemes for Arbitrary (n,k) Reed-Solomon Codes

AU - Liu, Wenhao

AU - Jiang, Zhengyi

AU - Huang, Zhongyi

AU - Song, Linqi

AU - Hou, Hanxu

PY - 2024

Y1 - 2024

N2 - The I/O cost, i.e., the total number of symbols to be read during the single node failure/repair process in a distributed storage system, is one of the most important metrics in repairing Reed-Solomon (RS) codes by the linear repair scheme. In this paper, we construct a linear repair scheme that is applicable to arbitrary (n, k) RS codes. We show that most existing repair schemes of RS codes can be viewed as a special case of our repair scheme. © 2024 IEEE.

AB - The I/O cost, i.e., the total number of symbols to be read during the single node failure/repair process in a distributed storage system, is one of the most important metrics in repairing Reed-Solomon (RS) codes by the linear repair scheme. In this paper, we construct a linear repair scheme that is applicable to arbitrary (n, k) RS codes. We show that most existing repair schemes of RS codes can be viewed as a special case of our repair scheme. © 2024 IEEE.

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U2 - 10.1109/ITW61385.2024.10806986

DO - 10.1109/ITW61385.2024.10806986

M3 - RGC 32 - Refereed conference paper (with host publication)

T3 - IEEE Information Theory Workshop, ITW

SP - 253

EP - 258

BT - 2024 IEEE Information Theory Workshop (ITW)

PB - IEEE

T2 - 2024 IEEE Information Theory Workshop (ITW'24)

Y2 - 24 November 2024 through 28 November 2024

ER -

On the I/O Cost of Linear Repair Schemes for Arbitrary (n,k) Reed-Solomon Codes

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