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ON OPTIMAL SETTING OF CONTROL LIMITS FOR GEOMETRIC CHART

  • M. Xie*
  • , T. N. Goh
  • , V. Kuralmani
  • *Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksReprint in bookpeer-review

Abstract

Control charts based on geometric distribution have shown to be very useful in the monitoring of high yield manufacturing processes and other applications. It is well known that the traditional 3-sigma limits will give too many false alarms and the probability limits should be used. This paper shows that the average time to alarm may even increase at the beginning when the process is deteriorated. A new procedure is established for the setting of control limits so that the average run length is maximized when the process is at the normal level. Hence the chart sensitivity can be improved. For the derivation of the control limits in this new procedure, a simple adjustment factor is suggested so that the probability limits can be used after the adjustment. © 2025 World Scientific Publishing Co. Pte. Ltd. All rights reserved.
Original languageEnglish
Title of host publicationReliability Engineering
EditorsHoang Pham
PublisherWorld Scientific Publishing Co. Pte Ltd
Pages261-269
ISBN (Electronic)9789819812547, 9789819812554
ISBN (Print)9789819812530
DOIs
Publication statusPublished - Jul 2025
Externally publishedYes

Bibliographical note

This is a reprint of: Xie, M., Goh, T. N., & Kuralmani, V. (2000). On optimal setting of control limits for geometric chart. International Journal of Reliability, Quality and Safety Engineering, 7(1), 17-25. https://doi.org/10.1142/S0218539300000031

Funding

This research is supported by a research grant from the National University of Singapore for the project “Some practical aspects of SPC for automated manufacturing process” (RP3981625).

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 9 - Industry, Innovation, and Infrastructure
    SDG 9 Industry, Innovation, and Infrastructure

Research Keywords

  • Average Run Length
  • Geometric Distribution
  • High-quality Process Control
  • Optimal Control Limits
  • Sensitivity Analysis
  • Statistical Process Control

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