On modelling reliability growth for software

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)567-570
Journal / PublicationIFAC Proceedings Series
Volume1
Issue number8
Publication statusPublished - 1989
Externally publishedYes

Conference

TitleEighth IFAC/IFORS Symposium on Identification and System Parameter Estimation 1988. Part 1
CityBeijing, China
Period27 - 31 August 1988

Abstract

There are several models suggested in studying software reliability. However, one of the widely used assumptions is that all faults contribute the same amount to the failure probability. In this paper we present some new models in which this assumption is not used. A software fault detection process is modelled by a Markov process with jump intensity which decreases as the number of faults detected increases. The intensity function may for example be a power type function of the number of the remaining faults. A sampling argument suggests that a second order power function may be a good approximation of the reality. We also present some numerical example on estimation model parameters with the maximum likelihood function.

Citation Format(s)

On modelling reliability growth for software. / Xie, M.; Bergman, B.
In: IFAC Proceedings Series, Vol. 1, No. 8, 1989, p. 567-570.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review