On modelling reliability growth for software
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 567-570 |
Journal / Publication | IFAC Proceedings Series |
Volume | 1 |
Issue number | 8 |
Publication status | Published - 1989 |
Externally published | Yes |
Conference
Title | Eighth IFAC/IFORS Symposium on Identification and System Parameter Estimation 1988. Part 1 |
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City | Beijing, China |
Period | 27 - 31 August 1988 |
Link(s)
Abstract
There are several models suggested in studying software reliability. However, one of the widely used assumptions is that all faults contribute the same amount to the failure probability. In this paper we present some new models in which this assumption is not used. A software fault detection process is modelled by a Markov process with jump intensity which decreases as the number of faults detected increases. The intensity function may for example be a power type function of the number of the remaining faults. A sampling argument suggests that a second order power function may be a good approximation of the reality. We also present some numerical example on estimation model parameters with the maximum likelihood function.
Citation Format(s)
On modelling reliability growth for software. / Xie, M.; Bergman, B.
In: IFAC Proceedings Series, Vol. 1, No. 8, 1989, p. 567-570.
In: IFAC Proceedings Series, Vol. 1, No. 8, 1989, p. 567-570.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review