On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations

Bo Song; Ning Xi; Ruiguo Yang; King Wai Chiu Lai; Chengeng Qu

doi:10.1109/NMDC.2010.5651906

On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations

Bo Song, Ning Xi^*, Ruiguo Yang, King Wai Chiu Lai, Chengeng Qu

^*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

6 Citations (Scopus)

Abstract

Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool. © 2010 IEEE.

Original language	English
Title of host publication	2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010
Pages	71-74
DOIs	https://doi.org/10.1109/NMDC.2010.5651906
Publication status	Published - 2010
Externally published	Yes
Event	4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010) - Monterey, United States Duration: 12 Oct 2010 → 15 Oct 2010

Conference

Conference	4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010)
Place	United States
City	Monterey
Period	12/10/10 → 15/10/10

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@inproceedings{1e0806dc67354b0caccc534fd0f469a8,

title = "On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations",

abstract = "Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool. {\textcopyright} 2010 IEEE.",

author = "Bo Song and Ning Xi and Ruiguo Yang and Lai, {King Wai Chiu} and Chengeng Qu",

year = "2010",

doi = "10.1109/NMDC.2010.5651906",

language = "English",

isbn = "9781424488964",

pages = "71--74",

booktitle = "2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010",

note = "4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010) ; Conference date: 12-10-2010 Through 15-10-2010",

}

Song, B, Xi, N, Yang, R, Lai, KWC & Qu, C 2010, On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations. in 2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010., 5651906, pp. 71-74, 4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010), Monterey, California, United States, 12/10/10. https://doi.org/10.1109/NMDC.2010.5651906

On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations. / Song, Bo; Xi, Ning; Yang, Ruiguo et al.
2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010. 2010. p. 71-74 5651906.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations

AU - Song, Bo

AU - Xi, Ning

AU - Yang, Ruiguo

AU - Lai, King Wai Chiu

AU - Qu, Chengeng

PY - 2010

Y1 - 2010

N2 - Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool. © 2010 IEEE.

AB - Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool. © 2010 IEEE.

UR - http://www.scopus.com/inward/record.url?scp=78751555868&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-78751555868&origin=recordpage

U2 - 10.1109/NMDC.2010.5651906

DO - 10.1109/NMDC.2010.5651906

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 9781424488964

SP - 71

EP - 74

BT - 2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010

T2 - 4th IEEE Nanotechnology Materials and Devices Conference (NMDC2010)

Y2 - 12 October 2010 through 15 October 2010

ER -

On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations

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