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On enduring more data through enabling page rewrite capability on multi-level-cell flash memory

Yu-Ming Chang, Chien-Chung Ho, Che-Wei Tsao, Shu-Hsien Liao, Wei-Chen Wang, Tei-Wei Kuo, Yuan-Hao Chang

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

The technology of NAND flash memory grows swiftly in response to the huge and rapidly changing storage market in recent years. Meanwhile, the demand for large amounts of data is also growing at an unprecedented scale. How to store more and more data over flash-based systems in a cost-effective way presents immense pressure and challenges to the system design. This motivates us to propose a breakthrough solution on the existing multi-level-cell flash memories such as TLC, being adopted in the mainstream solid-state drives. More specifically, we propose a durable management design through enabling page rewrite capability and incorporate it with the existing flash translation layer to achieve enduring more data written, even beyond the theoretical limit. Moreover, our management design further considers the adverse effect brought by disturbance, which could usually deteriorate the data correctness. The encouraging results through a series of experiments demonstrate the feasibility and the capability of our design. With the best setting we studied, the total amount of data that can be written into the system could be improved up to 2.14 times the baseline without adding any hardware cost.
Original languageEnglish
Title of host publicationProceedings of the 37th ACM/SIGAPP Symposium on Applied Computing
PublisherAssociation for Computing Machinery
Pages107-115
ISBN (Electronic)9781450387132
DOIs
Publication statusPublished - Apr 2022
Event37th ACM/SIGAPP Symposium on Applied Computing (SAC 2022) - Virtual, New York, United States
Duration: 25 Apr 202229 Apr 2022

Publication series

NameProceedings of the ACM Symposium on Applied Computing

Conference

Conference37th ACM/SIGAPP Symposium on Applied Computing (SAC 2022)
PlaceUnited States
CityNew York
Period25/04/2229/04/22

Research Keywords

  • disturbance
  • endurance
  • multi-level-cell
  • page rewrite

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