Observation of the elastic field related to a structural domain boundary along a {111}NiSi 2//{115}Si heterotwin interface
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 157-161 |
Journal / Publication | EPJ Applied Physics |
Volume | 2 |
Issue number | 2 |
Online published | 15 May 1998 |
Publication status | Published - May 1998 |
Externally published | Yes |
Link(s)
Abstract
A (111)NiSi 2//(115)Si heterotwin interface has been observed by high resolution electron microscopy (HREM) along the common direction [110]NiSi 2//[110]Si to identify the long period atomic structural units (ASU's). Coexistence of two different structural domains has been found with ASU's corresponding to two different cycles of five-, six-, and seven-atom rings. A dislocation/ledge (DL) has been particularly studied because its separates these two unusual cycles of ASU's. The elastic displacement field u of the atom columns around the DL has been calculated using both crystallographic and anisotropic elasticity properties of the crystals, assuming a two-dimensional u field. From a comparison between the positions of the atom columns as derived from elasticity calculations and as deduced from the HREM image, it is concluded that the DL is a mixed dislocation with the Burgers vector (-1/4)[111]NiSi 2 + (1/2)[110]Si = (1/12)[515]Si, a result also in agreement with the imperceptible ledge height associated with the DL core. Such a Burgers vector underlines the role of the Si matrix dislocations for producing such structural domains.
Citation Format(s)
Observation of the elastic field related to a structural domain boundary along a {111}NiSi 2//{115}Si heterotwin interface. / Bonnet, R.; Loubradou, M.; Chen, F. R.
In: EPJ Applied Physics, Vol. 2, No. 2, 05.1998, p. 157-161.
In: EPJ Applied Physics, Vol. 2, No. 2, 05.1998, p. 157-161.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review