Abstract
Numerical simulations were conducted to investigate the different potential distributions for an insulating sample on a conducting target holder. The surface potential on the sample was assumed to be 0, 1/5, 3/5 and 5/5 of the applied bias, respectively. It was found that the simulation results indicate that the plasma sheath configuration changes considerably and a low potential in the central zone leads to a lower ion dose.
| Original language | English |
|---|---|
| Journal | IEEE International Conference on Plasma Science |
| DOIs | |
| Publication status | Published - 2002 |
| Event | 2002 IEEE International Conference on plasma Science - Banff, Alta., Canada Duration: 26 May 2002 → 30 May 2002 |
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