Numerical simulation of current crowding phenomena and their effects on electromigration in very large scale integration interconnects

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Material Science

Biochemistry, Genetics and Molecular Biology

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Engineering

Research OutputsResearch Output authored by Numerical simulation of current crowding phenomena and their effects on electromigration in very large scale integration interconnects is tagged with the concept